E/sup 3/ software verification through the use of statistical process control methods
2002 IEEE International Symposium on Electromagnetic Compatibility - Tập 2 - Trang 788-790 vol.2
Tóm tắt
Questions about the validity of measurements made in an E/sup 3/ laboratory using software to control the instrumentation are a continuing concern for EMC engineers. In previous work, it has been shown that the use of statistical process control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system hardware setup, and in the data it produces. Once the hardware system stability has been demonstrated, it is possible to also utilize SPC historical information to assist in confirming the validity of the data gathered using the system's control software.
Từ khóa
#Process control #Control systems #System testing #Instruments #Electromagnetic compatibility #Hardware #System performance #Frequency measurement #Laboratories #Road transportationTài liệu tham khảo
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howard, 1988, SPC Charts for EMC Measurements
williams, 1998, Statistical Process Control in an E3 Laboratory, EMC 1998 Roma Symposium
wheeler, 1993, Understanding Variation: The key to managing chaos
shewart, 1931, Economic control of quality of manufactured product
