Development of an Integrated Thermocouple for the Accurate Sample Temperature Measurement During High Temperature Environmental Scanning Electron Microscopy (HT-ESEM) Experiments
Tóm tắt
Từ khóa
Tài liệu tham khảo
Knowles R.W. & Hardt T.A. (1996). High temperature specimen stage and detector for an environmental scanning electron microscope. Patent No. EP1003200B1.
Joly-Pottuz L. (2010). Microscopie environnementale à haute température: de l’intérêt de l’approche in-situ en temps réel pour la compréhension des phénomènes de frittage et d’oxydation des films minces. Nancy, France: GN-MEBA.
Podor R. , Pailhon D. , Brau H.P. & Ravaux J. (2013). Sample holder with integrated TC. Patent No. WO2013011022, January 24.