Dependence of the X-ray Sensitivity of AgGaS2 Single Crystals on Faces (001) and (100) on Dose and Hardness of Radiation

Pleiades Publishing Ltd - Tập 51 - Trang 117-125 - 2022
S. M. Asadov1, S. N. Mustafaeva2, D. T. Guseinov2, K. I. Kelbaliev1, V. F. Lukichev3
1Institute of Catalysis and Inorganic Chemistry Named after Academician Murtuza Naghiyev, National Academy of Sciences of Azerbaijan, Baku, Azerbaijan
2Institute of Physics, National Academy of Sciences of Azerbaijan, Baku, Azerbaijan
3Valiev Institute of Physics and Technology Institute, Russian Academy of Sciences, Moscow, Russia

Tóm tắt

The data of X-ray diffraction characteristics of silver thiogallate (AgGaS2) single crystals grown by the Bridgman–Stockbarger (BS) method on the (001) face and chemical transport reactions (CTRs) on the (100) face are presented. The X-ray conductivity coefficient of AgGaS2 at 298 K varies within 0.97–10.63 and 0.22–3.20 min/R for samples grown by the BS and CTR methods, respectively, at an effective radiation hardness of $${{V}_{a}}$$ = 25 to 50 keV and dose rate $$E$$ = 0.75–78.05 R/min. The dependence of the stationary X-ray current on the X-ray dose in AgGaS2 single crystals has a power-law character.

Tài liệu tham khảo

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