Demonstration of FinFET CMOS circuits

B.A. Rainey1, D.M. Fried1, M. Ieong, J. Kedzierski, E.J. Nowak1
1Microelectronic Division, IBM, Essex Junction, VT, USA

Tóm tắt

We present, to our knowledge, the first published experimental demonstration of a CMOS inverter chain built from FinFETs, completely integrated in 180nm CMOS technology, using one level of copper wiring and tungsten vias. A four-stage inverter chain with Lgate = 200nm, Tsi =, 60nm, and Tox = 2.2nm was run at 1.5V. We demonstrate successfully propagating CMOS levels through four inverter stages employing over 300 fins.

Từ khóa

#FinFETs #Circuits #Inverters #CMOS technology #Etching #Electrodes #Implants #Silicides #Tungsten #Voltage

Tài liệu tham khảo

10.1109/55.320976 choi, 2001, Sub 20 nm CMOS FinFET Technologies, Tech Dig 2001 IEDM, 421 kedzierski, 2001, High-Performance symmetric gate and CMOS-compatible Vt asynunetric gate FinFET devices, Technical Digest of the 2001IEDM, 437