Correlation between texture and average grain size in polycrystalline Ag thin films

Movchan, 1969, Fizika Metall., 28, 83 Thornton, 1974, J. Vac. Sci. Technol., 11, 666, 10.1116/1.1312732 Thompson, 1990, Annu. Rev. Mater. Sci., 20, 245, 10.1146/annurev.ms.20.080190.001333 Frost, 1994, Mater. Characterisation, 32, 257, 10.1016/1044-5803(94)90102-3 Srolovitz, 1986, J. Vac. Sci. Technol. A, 4, 2925, 10.1116/1.573662 Longworth, 1991, J. Appl. Phys., 69, 3929, 10.1063/1.348452 Dutta, 1970, J. Phys. D, 3, 839, 10.1088/0022-3727/3/6/303 Kakati, 1973, J. Phys. D, 6, 1307, 10.1088/0022-3727/6/11/303 Light, 1965, J. Vac. Sci. Technol., 3, 1, 10.1116/1.1492444 Gardiner, 1981, Thin Solid Films, 77, 335, 10.1016/0040-6090(81)90326-6 Gittis, 1985, Thin Solid Films, 130, 335, 10.1016/0040-6090(85)90364-5 Stambouli, 1990, Thin Solid Films, 193/194, 181, 10.1016/S0040-6090(05)80026-4 Huang, 1985, J. Vac. Sci. Technol. A, 3, 2161, 10.1116/1.573271 Maréchal, 1994, Thin Solid Films, 241, 34, 10.1016/0040-6090(94)90391-3 Hinton, 1963, J. Electrochem. Soc., 110, 103, 10.1149/1.2425684 Tomov, 1998, Vacuum, 50, 497, 10.1016/S0042-207X(98)00089-X I. Tomov, M. Adamik, P.B. Barna, Mater. Sci. Forum, (1999) in press. Sáfrán, 1993, Microscopia Elettronica, 14, 89 Tomov, 1996, Textures and Microstructures, 59, 26 Yamakov, 1999, J. Appl. Cryst., 32, 300, 10.1107/S0021889898013387 Chopra, 1969 Lewis, 1967, J. Vac. Sci. Technol., 4, 209, 10.1116/1.1492548 Gleiter, 1969, Acta Metall., 17, 565, 10.1016/0001-6160(69)90115-1 Adamik, 1998, Thin Solid Films, 317, 64, 10.1016/S0040-6090(97)00661-5 Barna, 1997, Protective Coatings and Thin Films: Synthesis, Characterisation and Applications, 279 Vandermeer, 1963, 211 Beck, 1950, J. Appl. Phys., 21, 420, 10.1063/1.1699676 Barrett, 1966 Aust, 1959, Met. Soc. AIME, 215, 119 Adamik, 1994, Phys. Stat. Sol. A, 145, 275, 10.1002/pssa.2211450207 d'Heurle, 1971, Met. Trans., 2, 683, 10.1007/BF02662722 Learn, 1974, J. Electr. Mater., 3, 531, 10.1007/BF02652956