Correction to: Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions

Microsystem Technologies - 2020
Kurmendra1, Rajesh Kumar2
1Department of Electronics and Communication Engineering, Rajiv Gandhi University (A Central University), Itanagar, India
2Department of Electronics and Communication Engineering, NERIST, Itanagar, India

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Microsystem Technologies

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