Comparison studies on growth modes of MBE grown ZnSe on GaAs [111] A and GaAs [111] B, using RHEED

F.S. Gard1, J.D. Riley1, R. Leckey1, B.F. Usher2
1Department of physics, La Trobe University, VIC, Australia
2Department Electronic Engineering, La Trobe university, VIC, Australia

Tóm tắt

In the last three decades, research into wide bandgap II-VI semiconductors was mainly concentrated on the growth and characterisation of ZnSe based structures on GaAs [001] substrates. Therefore, very little is known about the growth processes on {111} GaAs surfaces. This paper presents the comparison of surface processes during MBE hetero-epitaxial growth of ZnSe epilayers on GaAs [111] A, and GaAs [111] B substrates using reflection high-energy diffraction (RHEED).

Từ khóa

#Gallium arsenide #Zinc compounds #Surface reconstruction #Atomic layer deposition #Temperature #Substrates #Diffraction #Chemicals #MONOS devices #Etching

Tài liệu tham khảo

gard, 0, Surface and Interface Analysis 10.1016/0039-6028(94)91215-7 10.1016/S0169-4332(01)00380-4 10.1063/1.108682 10.1063/1.111528