Comparison of sensors and techniques for crop yield mapping

Computers and Electronics in Agriculture - Tập 14 - Trang 215-233 - 1996
Stuart J. Birrell1, Kenneth A. Sudduth2, Steven C. Borgelt1
1Department of Agricultural Engineering, University of Missouri, Columbia, MO 65211, USA
2USDA-Agricultural Research Service, University of Missouri, Columbia, MO 65211, USA

Tài liệu tham khảo

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