Combined Effects of $^{60}$Co Dose and High Frequency Interferences on a Discrete Bipolar Transistor

IEEE Transactions on Nuclear Science - Tập 59 Số 6 - Trang 3004-3010 - 2012
Adrien Doridant1, Jérémy Raoult1,2, Sylvie Jarrix1,2, Blain Amable1,3, Patrick Hoffmann4, N. Chatry5, P. Calvel6, L. Dusseau7,1,2
1IES - Institut d’Electronique et des Systèmes (860, rue Saint Priest, Bâtiment 5 - CC 05001 -34095 Montpellier Cedex 5 - France)
2RADIAC - Radiations et composants (France)
3TéHO - Térahertz, hyperfréquence et optique (France)
4EPFL - Ecole Polytechnique Fédérale de Lausanne (CH-1015 Lausanne, Switzerland - Switzerland)
5TRAD [Labège] (907 Voie l'Occitane 31670 Labège Cedex - France)
6Irset - Institut de recherche en santé, environnement et travail (263 avenue Général Leclerc 35042 Rennes Cedex - France)
7CSU - Centre Spatial Universitaire de Montpellier-Nîmes (Université de Montpellier, Bâtiment 21 - CC 06-001, Place Eugène Bataillon -34 095 Montpellier Cedex 5 - France)

Tóm tắt

Từ khóa


Tài liệu tham khảo

10.1049/el:20073130

10.1109/TEMC.2003.811312

10.1109/TIM.2008.926371

10.1109/TIM.2009.2023148

10.1109/TEMC.1979.303768

10.1109/JSSC.1979.1051320

10.1109/15.852414

10.1109/TNS.2008.2001409

10.1109/TNS.2007.910229

10.1109/TNS.2011.2181415

petrosky, 2010, Combined effects of electromagnetic interference (EMI) and ionizing radiation on digital inverters, Nuclear and Space Radiation Effects Conference

10.1063/1.2210293

jarrix, 2010, Preliminary studies of the impact of dose radiation on the electromagnetic susceptibility of comparators, Proc 9th Int Symp EMC Joint with 20th Int Wroclaw Symp EMC, 490

schrimpf, 2001, Physics and hardness assurance for bipolar technologies, Proc IEEE Nucl and Space Radiation Effects Conf NSREC Short Course

10.1109/TEMC.2008.2008907

10.1109/REDW.2003.1281310

Thông tin
Thông tin xuất bản

IEEE Transactions on Nuclear Science

Tập 59 Số 6

3004-3010

Thông tin tác giả