Chemical and electrical characterisation of the segregation of Al from a CuAl alloy (90%:10% wt) with thermal anneal

Thin Solid Films - Tập 599 - Trang 59-63 - 2016
C. Byrne1, A. Brady1, L. Walsh1, A.P. McCoy1, J. Bogan1, E. McGlynn2, K.V. Rajani3, G. Hughes1,2
1School of Physical Sciences, Dublin City University, Dublin 9, Ireland
2School of Physical Sciences, National Centre for Plasma Science and Technology, Dublin City University, Dublin 9, Ireland
3School of Electronic Engineering, Dublin City University, Dublin 9 Ireland

Tài liệu tham khảo

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