Characterization of molecular overlayers on metal surface in dynamic equilibrium by scanning tunneling microscope

Thin Solid Films - Tập 393 - Trang 325-328 - 2001
Hitoshi Suzuki1,2, Simon Berner1, Michael Brunner1, Hisao Yanagi3, Derck Schlettwein4, Thomas A Jung5, H.-J Güntherodt1
1Institut für Physik der Univeristät Basel, Klingelbergstr. 82, CH-4056, Basel, Switzerland
2Kansai Advanced Research Center, Communications Research Laboratory, 588-2 Iwaoka, Nishi-ku, Kobe 651-2492, Japan
3Faculty of Engineering, Kobe University, Rokkodai, Nada-ku, Kobe 657-8501, Japan
4Institut für Angewandte und Physikalische Chemie, Universität Bremen, P.O. Box 330440, D-28334 Bremen, Germany
5Labor für Mikro- und Nanostrukturen, Paul Scherrer Institut, Villigen, CH-5232, Switzerland

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Thin Solid Films

Tập 393

325-328

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