Characterization of Edgeless CdTe Detectors for use in Hard X-Ray Imaging Applications

IEEE Transactions on Nuclear Science - Tập 59 Số 4 - Trang 1536-1543 - 2012
Matthew C. Veale1, Steven Bell1, L.L. Jones1, P. Seller1, Matthew D. Wilson1, Robert J. Cernik2, J. Kalliopuska3, Helena Pohjonen3, H. Andersson4, S. Nenonen4, V. Kachkanov5
1STFC, Rutherford Appleton Laboratory, Chilton, UK
2School of Materials Science, University of Manchester, UK
3Microsystems and Nanoelectronics, VTT Technical Research Centre of Finland, Tietotie, Espoo, Finland
4Oxford Instruments Analytical, Espoo, Finland
5Harwell Science & Innovation Campus, Diamond Light Source, Chilton, UK

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