CdZnTe detectors for gamma spectroscopy and x-ray photon counting at 250 × 106 photons/(mm2 s)

Journal of Applied Physics - Tập 124 Số 4 - 2018
Michael Prokesch1, Stephen A. Soldner1, Arunmozhi G. Sundaram1
1eV Products, Inc.—A Kromek Company , 373 Saxonburg Blvd., Saxonburg, Pennsylvania 16056, USA

Tóm tắt

Using the traveling heater method, we have developed commercial CdZnTe (CZT) crystal growth, fabrication, and in-house test technologies for both, photon-starved gamma spectroscopic sensors and high-flux x-ray photon-counting for medical imaging and other applications. We compare the performance of different CZT material types for gamma spectroscopy and for high-flux x-ray imaging. We demonstrate single-threshold photon counting and basic imaging capability of pixelated CZT detectors at the highest x-ray fluxes we could generate in-house, i.e., ∼250 × 106 photons/(mm2 s). We show that the test system can be used for universal, absolute flux calibration of x-ray beams based on an accurate pile-up fitting algorithm. The detectors also perform spectroscopically under high-flux, when tested with energy discriminating electronics. A brief investigation on the effects of leakage, photo, and excess currents including their temporal behavior is also presented. Sub 1% uncorrected single-pixel resolution of the 662 keV 137Cs full energy peak was achieved with the gamma spectroscopy optimized material, fabricated into pixelated sensors.

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Journal of Applied Physics

Tập 124 Số 4

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