Application of back‐scattered electron imaging to the study of the lichen‐rock interface

Journal of Microscopy - Tập 175 Số 1 - Trang 54-59 - 1994
Jacek Wierzchoś1,2, Carmen Ascaso1
1Centro de Ciencias Medioambientales (CSIC), Serrano 215, bis, Madrid (28006), Spain
2Institute of Agrophysics, Polish Academy of Science, ul. Doswiadczalna 4, 20036, Lublin, Poland.

Tóm tắt

SummaryIn the study of the lichen‐rock interface, light microscopy, scanning electron microscopy (SEM) in secondary emission mode and transmission electron microscopy are the most commonly used techniques. As these methods have some limitations, there is a need to explore other techniques for observation of the lichen‐substrate interface. One of the most promising methods is the application of SEM in the back‐scattered electron (BSE) emission mode.The thallus ofAspicilia intermutans(Nyl.) Arn. growing on granitic rock was examined by SEM in BSE mode. The detailed preparation of transverse sections of the lichen‐rock contact zone is presented. The BSE scanning images of the lichen‐rock interface obtained present new insights into the ultrastructural features of the biological components, providing more information about the biogeophysical and biogeochemical weathering of rock.

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Journal of Microscopy

Tập 175 Số 1

54-59

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