Analyzing the impact of substrate noise on embedded analog-to-digital converters
ICCSC'02. 1st IEEE International Conference on Circuits and Systems for Communications. Proceedings (IEEE Cat. No.02EX605) - Trang 82-85
Tóm tắt
This paper presents the analysis and measurements of the impact of digital substrate noise on embedded Analog-to-Digital converters. The impact of substrate noise on analog design is explained, followed by a specific entire impact analysis of the impact on a regenerative comparator and an A/D converter. To confirm the analysis the substrate noise has also been measured on a test chip designed in a 0.35 /spl mu/m heavily-doped-substrate CMOS technology. From the measurements it was deduced that SNR and the effective number of bits are reduced by 20%.
Từ khóa
#Analog-digital conversion #MOSFETs #Noise measurement #Circuit noise #Semiconductor device measurement #Voltage #Equations #CMOS technology #Noise generators #TopologyTài liệu tham khảo
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