An expermental 16Mb DRAM with reduced peak-current noise

Daeje Chin1, Changhyun Kim1, Yun H. Choi1, Dong S. Min1, Hong S. Hwang1, Hoon Choi1, Soo I. Cho1, Tae Y. Chung1, Chan J. Park, Yoon S. Shin1, Kwangpyuk Suh1, Yong F. Park
1Semiconductor Business R & D Center, Samsung Electronics Company Limited, Gyeonggi, South Korea

Tóm tắt

In high-density DRAM'S, a large peak current of typically 200-300mA occurs when sense amplifiers start latching in a conventional scheme (Figure la), resulting in intolerable power bus noise. Four-phase drive for PMOS restoring was reported to reduce the peak current by triggering four pull-up transistors successively.[l] The initial sensing operation by NMOS latches, however, is more critical to signal margin and sensing speed

Từ khóa

#Random access memory #Sensors #Transistors #Latches #Process control #Photomicrography #Metals

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