A torsional resonance mode AFM for in-plane tip surface interactions

Zhong, 1993, Surf. Sci., 290, L688, 10.1016/0039-6028(93)90582-5 Garcı́a, 2002, Surf. Sci. Rep., 47, 197, 10.1016/S0167-5729(02)00077-8 Marcus, 2002, Phys. Rev. Lett., 88, 226103, 10.1103/PhysRevLett.88.226103 Mate, 1987, Phys. Rev. Lett., 59, 1942, 10.1103/PhysRevLett.59.1942 Maivald, 1991, Nanotechnology, 2, 103, 10.1088/0957-4484/2/2/004 O’Shea, 1992, Appl. Phys. Lett., 61, 2240, 10.1063/1.108254 Betzig, 1992, Appl. Phys. Lett., 60, 2484, 10.1063/1.106940 Ascoli, 1994, J. Vac. Sci. Technol. B, 12, 1642, 10.1116/1.587251 Grober, 1995, Rev. Sci. Instrum., 66, 3177, 10.1063/1.1145547 Colchero, 1996, Appl. Phys. Lett., 68, 2896, 10.1063/1.116324 Scherer, 1997, IEEE Trans. Magn., 33, 4077, 10.1109/20.619668 Scherer, 1999, Surf. Interface Anal., 27, 578, 10.1002/(SICI)1096-9918(199905/06)27:5/6<578::AID-SIA527>3.0.CO;2-5 Carpick, 1997, Chem. Rev., 97, 1163, 10.1021/cr960068q Carpick, 1997, Appl. Phys. Lett., 70, 1548, 10.1063/1.118639 Krotil, 2000, Appl. Phys. Lett., 77, 3857, 10.1063/1.1329630 Antognozzi, 2000, Rev. Sci. Instrum., 71, 1689, 10.1063/1.1150520 Jarvis, 2000, Appl. Surf. Sci., 157, 314, 10.1016/S0169-4332(99)00545-0 Pfeiffer, 2002, Phys. Rev. B, 65, 10.1103/PhysRevB.65.161403 Kawagishi, 2002, Ultramicroscopy, 91, 37, 10.1016/S0304-3991(02)00080-3 Gregor, 1996, Appl. Phys. Lett., 68, 307, 10.1063/1.116068 Davy, 1998, Appl. Phys. Lett., 73, 2594, 10.1063/1.122516 Brunner, 1999, J. Appl. Phys., 86, 7100, 10.1063/1.371798 Vaccaro, 2000, Appl. Phys. Lett., 77, 3110, 10.1063/1.1324728 Antognozzi, 2001, Appl. Phys. Lett., 78, 300, 10.1063/1.1339997 James, 2001, Langmuir, 17, 349, 10.1021/la000332h M. Antognozzi, H. Haschke, M.J. Miles, Abstracts of STM01, University of British Columbia, Vancouver, Canada, 2001, p. 439. C. Su, L. Huang, P. Neilson, V. Kelley, in: P.M. Koenraad, M. Kemerink (Eds.), Proc. 12th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, AIP, Melville, New York, 2003, p. 349. Spychalski-Merle, 2000, Appl. Phys. Lett., 77, 501, 10.1063/1.127024 Su, 2003, Ultramicroscopy, 97, 135, 10.1016/S0304-3991(03)00038-X