A simple model for the formation of compressive stress in thin films by ion bombardment

Thin Solid Films - Tập 226 Số 1 - Trang 30-34 - 1993
C. A. Davis1
1School of Physics, University of Sydney, Sydney, NSW 2006, Australia

Tóm tắt

Từ khóa


Tài liệu tham khảo

d'Heurle, 1989, Thin Solid Films, 171, 81, 10.1016/0040-6090(89)90035-7

Knotek, 1991, Surf. Coat. Technol., 46, 265, 10.1016/0257-8972(91)90169-W

Martin, 1986, Vacuum, 36, 585, 10.1016/0042-207X(86)90325-8

McKenzie, 1992, Appl. Opt.

Nakano, 1991, J. Vac. Sci. Technol. A, 9, 547, 10.1116/1.577406

McKenzie, 1991, Phys. Rev. Lett., 67, 773, 10.1103/PhysRevLett.67.773

Windischmann, 1991, J. Vac. Sci. Technol. A, 9, 2431, 10.1116/1.577295

Nir, 1986, J. Vac. Sci. Technol. A, 4, 2954, 10.1116/1.573667

Martin, 1992, Appl. Opt.

Yehoda, 1988, J. Vac. Sci. Technol. A, 6, 1631, 10.1116/1.575341

Muller, 1986, J. Appl. Phys., 59, 2803, 10.1063/1.336960

Seitz, 1956, Solid State Phys., 3, 305

Windischmann, 1987, J. Appl. Phys., 62, 1800, 10.1063/1.339560

Sigmund, 1981, vol. 1, 49

Muller, 1986, J. Vac. Sci. Technol. A, 4, 184, 10.1116/1.573468

Martin, 1991, Surf. Coat, Technol., 49, 239, 10.1016/0257-8972(91)90062-2

Davis, 1992, J. Appl. Phys., 72, 1740, 10.1063/1.351697

Muller, 1986, Appl. Phys. A, 40, 209, 10.1007/BF00616596

Puchert, 1992, J. Vac. Sci. Technol.