A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling conditions

Microelectronics Reliability - Tập 50 Số 1 - Trang 116-126 - 2010
Dominik Herkommer1, Jeff Punch1, Michael Reid1
1CTVR, Stokes Institute, University of Limerick, Limerick, Ireland

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Tài liệu tham khảo

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