A physical phantom for the calibration of three‐dimensional X‐ray microtomography examination

Journal of Microscopy - Tập 222 Số 2 - Trang 124-134 - 2006
Egon Perilli1,2, Fabio Baruffaldi2, Maria Cristina Bisi3, Luca Cristofolini4,2, Angelo Cappello1
1Department of Electronics, Computer Science and Systems, University of Bologna, Viale Risorgimento 2, 40136 Bologna, Italy
2Laboratorio di Tecnologia Medica, Istituti Ortopedici Rizzoli, Via di Barbiano 1/10, 40136 Bologna, Italy
3Second Faculty of Engineering, University of Bologna, Via Venezia 52, 47023 Cesena, Italy
4Dipartimento di Ingegneria delle Costruzioni Meccaniche, Nucleari, Aeronautiche e di Metallurgia, Università di Bologna, Viale Risorgimento 2, 40136 Bologna, Italy

Tóm tắt

SummaryX‐ray microtomography is rapidly gaining importance as a non‐destructive investigation technique, especially in the three‐dimensional examination of trabecular bone. Appropriate quantitative three‐dimensional parameters describing the investigated structure were introduced, such as the model‐independent thickness and the structure model index. The first parameter calculates a volume‐based thickness of the structure in three dimensions independent of an assumed structure type. The second parameter estimates the characteristic form of which the structure is composed, i.e. whether it is more plate‐like, rod‐like or even sphere‐like. These parameters are now experiencing a great diffusion and are rapidly growing in importance. To measure the accuracy of these three‐dimensional parameters, a physical three‐dimensional phantom containing different known geometries and thicknesses, resembling those of the examined structures, is needed. Unfortunately, such particular phantoms are not commonly available and neither does a consolidated standard exist. This work describes the realization of a calibration phantom for three‐dimensional X‐ray microtomography examination and reports an application example using an X‐ray microtomography system. The calibration phantom (external size 13 mm diameter, 23 mm height) was based on various aluminium inserts embedded in a cylinder of polymethylmethacrylate. The inserts had known geometries (wires, foils, meshes and spheres) and thicknesses (ranging from 20 µm to 1 mm). The phantom was successfully applied to an X‐ray microtomography device, providing imaging of the inserted structures and calculation of three‐dimensional parameters such as the model‐independent thickness and the structure model index. With the indications given in the present work it is possible to design a similar phantom in a histology laboratory and to adapt it to the requested applications.

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