A new technique for measuring the mechanical properties of thin films

Journal of Microelectromechanical Systems - Tập 6 Số 3 - Trang 193-199 - 1997
W. N. Sharpe1, Biao Yuan2, R. L. Edwards3
1Dept. of Mech. Eng., Johns Hopkins Univ., Baltimore, MD, USA
2Department of Mechanical Engineering, Johns Hopkins University, Baltimore, MD, USA
3Applied Physics Laboratory, Johns Hopkins University, Baltimore, MD, USA

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