A multi bit test trigger circuit for Mbit SRAM's

Symposium 1989 on VLSI Circuits - 1989
Miyaji1, Emort, Matsuyama1, Kanaishi1, Senoh1, Hagiwara1
1Semiconductor Group Research and Development Division, Sony Corporation, Atsugi, Kanagawa, Japan

Tóm tắt

In recent years, the memory bit density of SRAM's becomes higher and higher. On the other hand, the testing time which is composed of DC parametric and AC functional tests becomes longer and longer.

Từ khóa

#Trigger circuits #Testing #Random access memory #Heterojunction bipolar transistors #Pins #Organizations #CMOS technology

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Symposium 1989 on VLSI Circuits

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