Scanning near-field optical microscopy with aperture probes: Fundamentals and applications

Journal of Chemical Physics - Tập 112 Số 18 - Trang 7761-7774 - 2000
Bert Hecht1, Beate Sick1, Urs P. Wild1, Volker Deckert2, Renato Zenobi2, Olivier J. F. Martin3, Dieter Pohl4
1Physical Chemistry Laboratory, Swiss Federal Institute of Technology, ETH-Z, Universitätstr. 22, CH-8092 Zurich, Switzerland
2Organic Chemistry Laboratory, Swiss Federal Institute of Technology, ETH-Z, Universitätstr. 16, CH-8092 Zurich, Switzerland
3Electromagnetic Fields and Microwave Electronics Laboratory, Swiss Federal Institute of Technology, Gloriastrasse 35, ETZ ETH-Zentrum, CH-8092 Zurich, Switzerland
4Institute of Physics, University of Basel, Klingelbergstr. 82,CH-4056 Basel, Switzerland

Tóm tắt

In this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and field distributions in the vicinity of subwavelength apertures. Furthermore, the near-field optical image formation mechanism is analyzed with special emphasis on potential sources of artifacts. To underline the prospects of the technique, selected applications including amplitude and phase contrast imaging, fluorescence imaging, and Raman spectroscopy, as well as near-field optical desorption, are presented. These examples demonstrate that scanning near-field optical microscopy is no longer an exotic method but has matured into a valuable tool.

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