Electron Impact Relative Ionization Cross Sections and Fragmentation of U, UO, UO2, and UO3

Journal of Chemical Physics - Tập 56 Số 12 - Trang 6156-6164 - 1972
Paul Blackburn1, P. M. Danielson1
1Argonne National Laboratory, Chemical Engineering Division, Argonne, Illinois 60439

Tóm tắt

Electron impact relative ionization cross sections and fragmentation patterns of U, UO, UO2, and UO3 have been measured using 4–60-V electrons. Because the molecules are extensively fragmented, both total relative ionization cross sections and cross sections for production of parent ions are given. Values are tabulated as a function of ionizing voltage. The total cross sections at 40 V fail to conform to the additivity rule with the cross section of UO3 about half of that for U. Five volts above threshold, the total cross section ratio of UO3 to U is 0.08. Because of UO3 fragmentation, a smaller ratio in terms of parent ions of 0.025 is found. All three oxide molecules are severely fragmented by electron impact. At 40 V 85% of the ions produced from UO3 are fragments. For the U-O system, use of theoretical atomic ionization cross sections and the additivity rule leads to sizeable errors at high voltages and far greater errors at low voltage.

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Thông tin xuất bản

Journal of Chemical Physics

Tập 56 Số 12

6156-6164

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