Correlation between most 1/f noise and CCD transfer inefficiency
Tài liệu tham khảo
McWhorter, 1957, 207
Klaassen, 1971, IEEE Trans. Electron Devices, ED-18, 887, 10.1109/T-ED.1971.17301
Broux, 1975, Electron. Lett., 11, 97, 10.1049/el:19750074
Hsu, 1968, Appl. Phys. Lett., 12, 287, 10.1063/1.1651995
Leuenberger, 1971, Phys. Status Solidi a, 8, 545, 10.1002/pssa.2210080225
Maes, 1983, J. Appl. Phys., 54, 1937, 10.1063/1.332248
Vandamme, 1980, Solid-State Electron, 23, 317, 10.1016/0038-1101(80)90198-7
Vandamme, 1980, 228
Vandamme, 1981, 244
Vandamme, 1980, Solid-State Electron, 23, 325, 10.1016/0038-1101(80)90199-9
van der Ziel, 1980, 212
Katto, 1975, Proc. 6th Conf. on Solid State Devices, 44, 243
Mikoshiba, 1982, IEEE Trans. Electron Devices, ED-29, 965, 10.1109/T-ED.1982.20815
Penning de Vries, 1984, IEEE Trans. Electron Devices, ED-31, 1454, 10.1109/T-ED.1984.21732
Hooge, 1972, Physica, 60, 130, 10.1016/0031-8914(72)90226-1
1982, Physica, 114B, 391
Hooge, 1981, Rep. Prog. Phys., 44, 479, 10.1088/0034-4885/44/5/001
Vandamme, 1983, 183
L.K.J. Vandamme and S. Oosterhoff, submitted to J. Appl. Phys.
Surdin, 1939, J. Phys. Radium (Paris), 10, 188, 10.1051/jphysrad:01939001004018800
Van der Ziel, 1959
Müller, 1979, Rauschen, 64
Ambrózy, 1982, 108
Kleinpenning, 1981, J. Appl. Phys., 52, 1594, 10.1063/1.329647
Liu, 1980, 252