Determination of the transport parameters in two-dimensional semiconductor systems and thin films by contactless microwave methods

A.A. Kornilovich1
1Novosibirsk State Technical University, Novosibirsk, Russia

Tóm tắt

The results of theoretical and experimental study of Shubnikov-de Haas effect and cyclotron resonance by microwave methods (/spl omega//2/spl pi/=37.8GHz) in AlGaAs/GaAs heterostructures are presented. The theoretical expressions for the determination of the carrier concentration and mobility are obtained. With these data, the transport parameters in two-dimensional systems and thin films can be determined with an accuracy /spl sim/0.5%.

Từ khóa

#Semiconductor thin films #Gallium arsenide #Microwave theory and techniques #Cyclotrons #Magnetic resonance #Power measurement #Electron optics #Optical films #Optical superlattices #Reflectivity

Tài liệu tham khảo

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