Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses
2002 IEEE International Symposium on Electromagnetic Compatibility - Tập 1 - Trang 87-92 vol.1
Tóm tắt
In this paper the influence of TTL- and CMOS-technology on the destruction effects of semiconductors by impact of EMP and UWB pulses is determined. Different logic devices like NANDs and inverters were exposed to high amplitude transient pulses.
Từ khóa
#EMP radiation effects #Electric breakdown #Pulse measurements #Electromagnetic waveguides #CMOS technology #Electric variables measurement #Electromagnetic transients #Electromagnetic fields #Electromagnetic measurements #ModemsTài liệu tham khảo
10.1109/ISEMC.2001.950538
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