Bestimmung der Lebensdauer des 3P-Zustands von ionisiertem Helium aus der Linienbreite von Hochfrequenzübergängen

Springer Science and Business Media LLC - Tập 249 - Trang 73-77 - 2016
A. Eibofner1
1Physikalisches Institut der Universität Tübingen, Deutschland

Tóm tắt

The dependence of the half-widths of 3S 1/2(m=−1/2)↔3P 1/2(m=−1/2)-transition signals in ionized helium on rf power has been measured. By linear extrapolation of the squared half-widths towards zero power, a value of τ3P =(0.324±0.011) nsec for the lifetime of the 3P-state has been deduced (theoretical value 0.329 nsec).