Thickness dependence of In2O3:Sn film growth

Latz, 1991, Jpn. J. Appl. Phys., 30, L149, 10.1143/JJAP.30.L149 Kim, 1998, J. Appl. Phys., 84, 6859, 10.1063/1.368981 Topart, 1999, Thin Solid Films, 352, 243, 10.1016/S0040-6090(99)00401-0 Hamberg, 1986, J. Appl. Phys., 60, 123, 10.1063/1.337534 Löbl, 1996, Surf. Coat. Technol., 82, 90, 10.1016/0257-8972(95)02644-4 Kim, 2000, J. Appl. Phys, 88, 6021, 10.1063/1.1318368 Guittoum, 1999, Eur. Phys. J., 7, 201 Lee, 1997, Thin Solid Films, 302, 25, 10.1016/S0040-6090(96)09581-8 M. Theiss, Hard- and software for Optical Spectroscopy, Dr. Bernhard-Klein-Str. 110, 52078 Aachen, Germany, www.mtheiss.com.. Mergel, 2002, J. Phys., D, Appl. Phys., 35, 794, 10.1088/0022-3727/35/8/311 Z. Qiao, PhD thesis, University of Duisburg-Essen, Germany, 2003. Jenkins, 1978 You, 2001, Thin Solid Films, 401, 229, 10.1016/S0040-6090(01)01488-2 Mergel, 2000, J. Appl. Phys., 88, 2437, 10.1063/1.1287603 Shigesato, 1991, Appl. Surf. Sci., 48/49, 269, 10.1016/0169-4332(91)90343-I Mader, 1970, 9 Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 1991, JCPDS-ICDD. Shigesato, 1994, Thin Solid Films, 238, 44, 10.1016/0040-6090(94)90646-7 Köstlin, 1975, Phys. Status Solidi, A, 29, 87, 10.1002/pssa.2210290110 Hu, 1992, J. Appl. Phys., 71, 880, 10.1063/1.351309 Kamei, 1995, Thin Solid Films, 259, 38, 10.1016/0040-6090(94)06390-7 Thilakan, 1997, Vacuum, 48, 463, 10.1016/S0042-207X(96)00309-0 Terzini, 2000, Mater. Sci. Eng., B77, 110, 10.1016/S0921-5107(00)00477-3 Kumar, 1989, J. Appl, Phys., 65, 1270, 10.1063/1.343022 Meng, 1997, Thin Solid Films, 303, 151, 10.1016/S0040-6090(97)00050-3 Latz, 1997, J. Non-Cryst. Solids, 218, 329, 10.1016/S0022-3093(97)00295-0