Design and implementation of a low cost test bench to assess the reliability of FPGA

Iwai, 2009, Technology roadmap for 22nm and beyond, 1 Kim, 2010, Challenges for nanoscale mosfets and emerging nanoelectronics, Trans. Electr. Electron. Mater, 11, 93, 10.4313/TEEM.2010.11.3.093 Borkar, 2006, Tackling variability and reliability challenges, IEEE Des. Test, 23, 0520, 10.1109/MDT.2006.156 Stott, 2010, Degradation analysis and mitigation in fpgas, 428 Srinivasan, 2008, Toward increasing fpga lifetime, IEEE Trans. Dependable Secure Comput., 5, 115, 10.1109/TDSC.2007.70235 Amouri, 2014, Aging effects in fpgas: an experimental analysis, 1