Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
Tóm tắt
We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles.
Tài liệu tham khảo
Wang X, Hu X, Li Y, Jia W, Xu C, Liu X, Zi J: Enlargement of omnidirectional total reflection frequency range in one-dimensional photonic crystals by using photonic heterostructures. Appl Phys Lett 2002, 80: 23.
Bria D, Djafari-Rouhani B, El Boudouti E H, Mir A, Akjouj ANougaoui A: Omnidirectional optical mirror in a cladded-superlattice structure. J Appl Phys 2002, 91: 5.
Srivastava R, Pati S, Ojha SP: Enhancement of omnidirectional reflection in photonic crystal heterostructures. PIER B 2008, 1: 197.
Xi J-Q, Ojha M, Cho W, Plawsky JL, Gill WN, Gessmann T, Schubert EF: Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material. Opt Lett 2005, 30: 12.
Awasthi SK, Malaviya U, Ojha SP: Enhancement of omnidirectional total-reflection wavelength range by using one-dimensional ternary photonic bandgap material. J Opt Soc Am B 2006, 23: 12.
Temelkuran B, Thomas EL, Joannopoulos JD, Fink Y: Low-loss infrared dielectric material system for broadband dual-range omnidirectional reflectivity. Opt Lett 2001, 26: 17.
Park Y, Roh T-G, Cho C-O, Heonsu Jeon Sung MG: GaAs-based near-infrared omnidirectional reflector. Appl Phys Lett 2003, 82: 17.
Lin W, Wang GP, Zhang S: Design and fabrication of omnidirectional reflectors in the visible range. J Mod Opt 2005, 52: 8.
Ben Ali N, Kanzari M: Designing of omni-directional high reflectors by using one-dimensional modified hybrid Fibonacci/Cantor band-gap structures at optical telecommunication wavelength band. J Mod Opt 2010, 57: 4.
Deopura M, Ullal CK, Temelkuran B, Fink Y: Dielectric omnidirectional visible reflector. Opt Lett 2001, 26: 15.
Kim S-H, Hwangbo CK: Design of omnidirectional high reflectors with quarter-wave dielectric stacks for optical telecommunication bands. Appl Opt 2002, 41: 16.
Krumbholz N, Gerlach K, Rutz F, Koch M, Piesiewicz R, Krner T, Mittleman D: Omnidirectional terahertz mirrors: a key element for future terahertz communication systems. Appl Phys Lett 2006, 88: 202905.
Kim JK, Gessmann T, Schubert EF, Luo H, Cho J, Sone C, Park Y, Xi J-Q: GaInN light-emitting diode with conductive omnidirectional reflector having a low-refractive-index indium-tin oxide layer. Appl Phys Lett 2006, 88: 013501.
Xifré-Pérez E, Marsal LF, Pallarès J, Ferré-Borrull J: Porous silicon mirrors with enlarged omnidirectional band gap. J Appl Phys 2005, 97: 064503.
Estevez JO, Arriaga J, Méndez Blas A, Agarwal V: Omnidirectional photonic bandgaps in porous silicon based mirrors with a Gaussian profile refractive index. Appl Phys Lett 2008, 93: 191915.
Estevez JO, Arriaga J, Méndez Blas A, Agarwal V: Enlargement of omnidirectional photonic bandgap in porous silicon dielectric mirrors with a Gaussian profile refractive index. Appl Phys Lett 2009, 94: 061914.
Bruyant A, Lérondel G, Reece PJ, Gal M: All-silicon omnidirectional mirrors based on one-dimensional photonic crystals. Appl Phys Lett 2003, 82: 3227.
Xifré-Pérez E, Marsal LF, Ferré-Borrull J, Pallarès J: Low refractive index contrast porous silicon omnidirectional reflectors. Appl Phys B 2009, 95: 169.
Escorcia J, Agarwal V: Effect of duty cycle and frequency on the morphology of porous silicon formed by alternating square pulse anodic etching. Phys Stat Sol c 2007, 4: 6.
Kheraj VA, Panchal CJ, Desai MS, Potbhare V: Simulation of reflectivity spectrum for non-absorbing multilayer optical thin films. PRAMANA J Phys 2009, 72: 6.
Ariza-Flores AD, Gaggero-Sager LM, Agarwal V: Effect of interface gradient on the optical properties of multilayered porous silicon photonic structures. J Phys D: Appl Phys 2011, 44: 155102.
Manotas S, Agulló-Rueda F, Moreno JD, Ben-Hander F, Martínez-Duart JM: Lattice-mismatch induced-stress in porous silicon films. Thin Solid Films 2001, 401: 306.
Manotas S, Agulló-Rueda F, Moreno JD, Martín-Palma RJ, Guerrero-Lemus R, Martínez-Duart JM: Depth-resolved microspectroscopy of porous silicon multilayers. Appl Phys Lett 1999, 75: 7.