Characterization of CdS thin films grown by chemical bath deposition using four different cadmium sources

Thin Solid Films - Tập 516 - Trang 7306-7312 - 2008
Hani Khallaf1, Isaiah O. Oladeji2, Guangyu Chai3, Lee Chow1
1Department of Physics, University of Central Florida, Orlando, FL 32816, USA
2SOLMAX TECHNOLOGIES, 1209 West Gore St., Orlando, FL 32805, USA
3Apollo Technologies, Inc., 205 Waymont Court, Suite 111, Lake Mary, FL 32746, USA

Tài liệu tham khảo

Mokrushin, 1961, Kolloidn. Z., 23, 438 Kitaev, 1965, Russ. J. Phys. Chem., 39, 1101 Oladeji, 2000, Sol. Energy Mater. Sol. Cells, 61, 203, 10.1016/S0927-0248(99)00114-2 Contreras, 2002, Thin Solid Films, 403/404, 204, 10.1016/S0040-6090(01)01538-3 Davis, 1999, J. Electrochem. Soc., 146, 1046, 10.1149/1.1391719 Contreras, 1999, Prog. Photovolt: Res. Appl., 7, 311, 10.1002/(SICI)1099-159X(199907/08)7:4<311::AID-PIP274>3.0.CO;2-G Wu, 2001, 995 Dona, 1992, J. Electrochem. Soc., 139, 2810, 10.1149/1.2068984 Metin, 2003, Semicond. Sci. Technol., 18, 647, 10.1088/0268-1242/18/7/308 Oladeji, 1997, J. Electrochem. Soc., 144, 2342, 10.1149/1.1837815 Rami, 1999, Solid State Sci., 1, 179, 10.1016/S1293-2558(00)80073-4 Nair, 1988, Semicond. Sci. Technol., 3, 134, 10.1088/0268-1242/3/2/010 O'Brien, 1996, J. Cryst. Growth, 158, 497, 10.1016/0022-0248(95)00467-X Kaur, 1980, J. Electrochem. Soc., 127, 943, 10.1149/1.2129792 Nagao, 1968, Japan. J. Appl. Phys., 7, 684, 10.1143/JJAP.7.684 Kitaev, 1965, Kolloidn. Z., 27, 51 Ortega-Borges, 1993, J. Electrochem. Soc., 140, 3464, 10.1149/1.2221111 Nakanishi, 1994, Sol. Energy Mater. Sol. Cells, 35, 171, 10.1016/0927-0248(94)90137-6 Guillén, 1998, Thin Solid Films, 335, 37, 10.1016/S0040-6090(98)00873-6 Chu, 1992, J. Electrochem. Soc., 139, 2443, 10.1149/1.2221246 Nair, 1988, Thin Solid Films, 161, 21, 10.1016/0040-6090(88)90232-5 Reádigos, 2000, Semicond. Sci. Technol., 15, 1022, 10.1088/0268-1242/15/11/302 Sillén, 1964 1997, Inorganic Crystal Structure Database Sze, 1981 Chichibu, 1998, J. Appl. Phys., 83, 3678, 10.1063/1.366588 Kaelble, 1967 Doolittle, 1986, Nucl. Instr. Methods B, 15, 227, 10.1016/0168-583X(86)90291-0 Mártil, 1984, J. Vac. Sci. Technol., A, 2, 1491, 10.1116/1.572389 Mártil, 1984, Thin Solid Films, 114, 327, 10.1016/0040-6090(84)90132-9