Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale

American Association for the Advancement of Science (AAAS) - Tập 251 Số 5000 - Trang 1468-1470 - 1991
Eric Betzig1, J. K. Trautman1, T.D. Harris1, J. Weiner1, R. L. Kostelak1
1AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974

Tóm tắt

In near-field scanning optical microscopy, a light source or detector with dimensions less than the wavelength (λ) is placed in close proximity (<λ/50) to a sample to generate images with resolution better than the diffraction limit. A near-field probe has been developed that yields a resolution of ∼12 nm (∼λ/43) and signals ∼10 4 - to 10 6 -fold larger than those reported previously. In addition, image contrast is demonstrated to be highly polarization dependent. With these probes, near-field microscopy appears poised to fulfill its promise by combining the power of optical characterization methods with nanometric spatial resolution.

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American Association for the Advancement of Science (AAAS)

Tập 251 Số 5000

1468-1470

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