International Union of Crystallography (IUCr)

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Crystal structure of the Li18Cu15Al7intermetallic compound
International Union of Crystallography (IUCr) - Tập 66 Số a1 - Trang s150-s151 - 2010
Grygoriy Dmytriv, Volodymyr Pavlyuk, I. Tarasiuk, Helmut Ehrenberg, Igor Chumak, Hermann Pauly
SHELX-84: a program system for crystal structure solution and refinement
International Union of Crystallography (IUCr) - Tập 40 Số a1 - Trang C440-C440 - 1984
George M. Sheldrick
The molecular replacement method
International Union of Crystallography (IUCr) - Tập 46 Số 2 - Trang 73-82 - 1990
Michael G. Rossmann

Molecular replacement can be used for obtaining approximate phasing of an unknown structure from a known related molecule and for phase improvement as well as extension in the presence of noncrystallographic symmetry. Emphasis is placed on the latter procedure. It is shown that the real-space method of iterative electron density averaging and Fourier back transformation corresponds to iterative phase substitution in the right-hand side of expressions to give a set of improved phases. Analysis of these expressions (the 'molecular replacement equations') provides insight into the limits of possible phase extension, and the implications for the use of calculated structure factors when there are no observed amplitudes. It is shown that the percentage of observed data and inaccuracy of the observed amplitudes available for phase extension are compensated by the extent of noncrystallographic redundancy and the fraction of crystal cell volume that may be flattened because it is outside the control of noncrystallographic symmetry.

CrystalExplorer: a tool for displaying Hirshfeld surfaces and visualising intermolecular interactions in molecular crystals
International Union of Crystallography (IUCr) - Tập 62 Số a1 - Trang s90-s90 - 2006
Dylan Jayatilaka, Stephen K. Wolff, Daniel J. Grimwood, Joshua J. McKinnon, Mark A. Spackman
Crystallographic refinement by simulated annealing: application to crambin
International Union of Crystallography (IUCr) - Tập 45 Số 1 - Trang 50-61 - 1989
Axel T. Brünger, Martin Karplus, Gregory A. Petsko
Report of the Executive Committee for 1991
International Union of Crystallography (IUCr) - Tập 48 Số 6 - Trang 922-946 - 1992
Visibility of single heavy atoms on thin crystalline silicon in simulated annular dark-field STEM images
International Union of Crystallography (IUCr) - Tập 44 Số 6 - Trang 912-927 - 1988
Russell F. Loane, E. J. Kirkland, J. Silcox
Refinement of crystal structural parameters using two-dimensional energy-filtered CBED patterns
International Union of Crystallography (IUCr) - Tập 55 Số 5 - Trang 939-954 - 1999
Kenji Tsuda, Michiyoshi Tanaka

A new method to refine crystal structural parameters using convergent-beam electron diffraction (CBED), which is applicable to nanometre-size crystal structure analysis, is proposed. This method is based on the fitting between theoretical calculations and experimental intensities of energy-filtered two-dimensional CBED patterns containing higher-order Laue-zone (HOLZ) reflections. The use of HOLZ reflections is essential for the method because small displacements of atoms can be sensitively detected using HOLZ reflections with large reciprocal vectors. For this purpose, a new Ω-filter transmission microscope (JEM-2010FEF), which can take energy-filtered CBED patterns up to a high angle with a small distortion, and a new analysis program to refine structural parameters, which is based on many-beam Bloch-wave calculations and nonlinear least-squares fitting, have been developed. As a test example, a positional parameter and isotropic and anisotropic Debye–Waller factors of CdS have been refined. Two-dimensional CBED patterns calculated with the refined parameters show very good agreement with the experimental ones, and the refined values of the parameters also agree well with the result of a single-crystal X-ray diffraction experiment. Important problems of the analysis procedure are discussed item by item.

Slow-cooling protocols for crystallographic refinement by simulated annealing
International Union of Crystallography (IUCr) - Tập 46 Số 7 - Trang 585-593 - 1990
Axel T. Brünger, Anton E. Krukowski, John W. Erickson
Considerations of efficiency and precision in four-circle diffractometry
International Union of Crystallography (IUCr) - Tập 37 Số a1 - Trang C313-C314 - 1981
W. Clegg
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