X-ray topographic study of defects in KH2PO4 single crystals and their relation with impurity segregation

Journal of Crystal Growth - Tập 23 - Trang 243-252 - 1974
C. Belouet1
1Laboratoires d'Electronique et de Physique Appliquée (LEP), 94450 Limeil-Brévannes, France

Tài liệu tham khảo

Marie, 1967, Philips Res. Rept., 22, 110 Salvo, 1971, IEEE Trans. Electron Devices, ED-18, 748, 10.1109/T-ED.1971.17276 O'Keefe, 1967, J. Phys. Chem. Solids, 28, 211, 10.1016/0022-3697(67)90110-2 Belouet, 1973 Mullin, 1967, J. Appl. Chem., 17, 151, 10.1002/jctb.5010170508 Lang, 1959, Acta Cryst., 12, 249, 10.1107/S0365110X59000706 Deslattes, 1966, J. Appl. Phys., 37, 541, 10.1063/1.1708211 Eshelby, 1951, Phil. Mag., 42, 1401, 10.1080/14786445108560958 Tunstall, 1964, Phil. Mag., 9, 99, 10.1080/14786436408217476 Authier, 1967, Vol. 10, 9 Epelboin, 1973, J. Crystal Growth, 20, 103, 10.1016/0022-0248(73)90122-X Lutsau, 1970, Kristall und Technik, 5, 10.1002/crat.19700050310 Fischman, 1970, Phys. Status Solidi (a), 3, 829, 10.1002/pssa.19700030330 Belouet, 1973, Acta Electronica, 16, 345 C. Belouet, M. Monnier and J.C. Verplanke, to be published. Polcarova, 1968, Bull. Soc. Franc. Mineral. Crist., 91, 645