Wavelength mapping of mixed semiconductors using an automatic IR spectrophotometer

Infrared Physics - Tập 24 Số 5 - Trang 473-481 - 1984
P. Capper1, C. L. Jones1, I. Kenworthy1, Maxwell R. Bennett2, David F. Davidson2, J. McIntosh2
1Mullard, Southampton, Hants, England
2Edinburgh Instruments Ltd, Riccarton, Edinburgh, Scotland

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Tài liệu tham khảo

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