Using quantitative electron microscopy for process mineralogy applications

JOM - Tập 52 Số 4 - Trang 24-25 - 2000
Paul Gottlieb1, Gregory John Wilkie1, D.N. Sutherland1, E. Ho-Tun1, S. P. Suthers1, K. S. Perera1, Benjamin M. Jenkins1, Steven J. Spencer1, Alan R. Butcher1, John L. Rayner1
1the QEM*SEM image analysis team, CSIRO Minerals, USA

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Từ khóa


Tài liệu tham khảo

A.F. Reid et al., “QEM*SEM Image Analysis of Ore Minerals: Volume Fraction, Liberation and Observational Variances,” Applied Mineralogy, ed. W.C. Park, D.M. Hausen, and R.D. Hagni (Warrendale, PA: TMS, 1984), pp. 191–204.

P.R. Miller, A.F. Reid, and M.A. Zuiderwyk, “QEM*SEM Image Analysis in the Determination of Modal Assays, Mineral Association and Mineral Liberation,” Proc. XIV Int. Mineral Processing Congress (Toronto, Canada: CIM, 1982), Paper VIII-3.

K.R. Weller, S. Morrell, and P. Gottlieb, “Use of Grinding and Liberation Models to Simulate Tower Mill Circuit Performance in a Lead/Zinc Concentrator to Increase Flotation Recovery,” Int. J. Miner. Process, 44–45 (1996), pp. 683–702.

B.M. Jenkins, R. Zhu, and J. Esterle, “Ergodicity: The Challenge of Sampling for Automated Microscopy in the Minerals Industry,” Proc. Digital Image Computing: Techniques and Applications (Brisbane, Australia: APRS, 1995), pp. 401–407.

R.P. King and C.L. Schneider, Powder Technology, 98 (1998), pp. 21–37.