Thin layers composition and impurities determination using low energy proton X-ray excitation

Nuclear Instruments and Methods - Tập 117 - Trang 579-587 - 1974
Jean Paul Thomas1, Louis Porte1, Jean Engerran1, Jean Claude Viala1, Jean Tousset1
1Institut de Physique Nucléaire and Laboratoire de physico-chimie minérale, 43 bd du 11 novembre 1918, 69621-Villeurbanne, France

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