Thermal drift reduction with multiple bias current for MOSFET dosimeters

10.1016/j.sna.2005.08.020

10.1109/23.903786

Benson C, 2004, Phys. Med. Biol., 49, 3145, 10.1088/0031-9155/49/14/009

Best S, 2005, Phys. Med. Biol., 50, 5909, 10.1088/0031-9155/50/24/010

10.1016/S0167-8140(03)00035-5

10.1109/23.273520

Carvajal M A, 2009, Phys. Med. Biol., 54, 6263, 10.1088/0031-9155/54/20/015

10.1016/j.sna.2009.11.034

Cheung T, 2004, Phys. Med. Biol., 49, 191, 10.1088/0031-9155/49/13/N02

10.1109/23.685226

10.1016/j.ijrobp.2005.02.049

Fraden J, 1996, Handbook of Modern Sensors: Physics, Designs and Applications

10.1109/TNS.2004.835065

10.1016/1359-0197(86)90134-7

10.1016/0360-3016(88)90019-3

10.1109/TNS.2002.805344

10.1109/TNS.2003.821399

10.1016/j.radmeas.2007.12.052

10.1109/23.124162

Ma T P, 1989, Ionizing Radiation Effects in MOS Devices and Circuits

10.1109/23.658988

O'Sullivan M Kelleher A Ryan J O'Neill Band Lane B, 1990, Proc. ESA Electronic Components Conf., 81

Palma A J Carvajal M A Asensio L J, 2008

Rosenfeld A B, 2002, Radiat. Prot. Dosim., 101, 393, 10.1093/oxfordjournals.rpd.a006009

10.1109/23.983173

10.1109/5289.685494

10.1109/23.819125

, 2005, OneDose User's Manual Pre-production draft version, rev. P01

10.1109/23.211375

10.1118/1.597314

Sze S M, 1981, Physics of Semiconductor Devices

10.1109/TNS.2004.829372

Thomson & Nielsen, 1991

10.1109/23.736526

Tsividis Y, 1999, Operation and Modelling of the MOS Transistor

10.1109/23.510745