Theory of the MOS transistor in weak inversion-new method to determine the number of surface states

IEEE Transactions on Electron Devices - Tập 22 Số 5 - Trang 282-288 - 1975
R.J. Van Overstraeten1, G. Declerck2, Paul A. Muls2
1Katholieke Universiteit Leuven, Heverlee, Belgium
2[Fysica en Elektronica Halfgeleiders Laboratorium, Department Elektrotechniek, Katholieke Universiteit Leuven, Heverlee, Belgium]

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Từ khóa


Tài liệu tham khảo

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van overstraeten, 1973, the influence of surface potential fluctuations on the operation of the mos transistor in weak inversion, IEEE Transactions on Electron Devices, 20, 1154, 10.1109/T-ED.1973.17810

van overstraeten, 1973, inadequacy of the classical theory of the mos transistor operating in weak inversion, IEEE Transactions on Electron Devices, 20, 1150, 10.1109/T-ED.1973.17809