Theoretical comparison of SiC PiN and Schottky diodes based on power dissipation considerations

IEEE Transactions on Electron Devices - Tập 49 Số 9 - Trang 1657-1664 - 2002
D.T. Morisette1, J.A. Cooper2
1OptoLynx, Inc., West Lafayette, IN, USA
2School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

Tóm tắt

In order to select the optimal device for a particular application, designers must carefully analyze the tradeoffs between competing devices. Recent progress in SiC power rectifiers has resulted in the demonstration of high-voltage PiN and Schottky barrier diodes (SBDs). With both technologies maturing, power electronics engineers will soon face the task of selecting between these two devices. Until recently, the choice was simple, since silicon SBDs are only available for relatively low voltage applications. The choice is not as clear when considering SiC diodes, and guidelines for determining the proper application of each are needed. The purpose of this paper is to provide such guidelines, based on an analysis of the most significant tradeoffs involved.

Từ khóa

#Silicon compounds #Schottky diodes #p-i-n diodes #Solid state rectifiers #Power semiconductor diodes #Current density #Charge carrier lifetime

Tài liệu tham khảo

rhoderick, 1978, Metal-Semiconductor Contacts 10.1063/1.119478 morisette, 2001, Development of robust power Schottky barrier diodes in silicon carbide baliga, 1996, Power Semiconductor Devices 10.1557/PROC-339-595 neudeck, 1994, silicon carbide buried-gate junction field effect transistors for high-temperature power electronic applications, Proc 2nd Int High Temperature Electronic Conf, 23