The relationship between the macroscopic properties of PECVD silicon nitride and oxynitride layers and the characteristics of their networks

Applied Physics A Solids and Surfaces - Tập 74 Số 2 - Trang 181-186 - 2002
Marta Klanjšek Gunde1, Marijan Maček2
1National Institute of Chemistry, SI-1000 Ljubljana, Hajdrihova 19, Slovenia, , SI
2Faculty of Electrical Engineering, SI-1000 Ljubljana, Tržaška 25, Slovenia, , SI

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