The 100th anniversary of the four-point probe technique: the role of probe geometries in isotropic and anisotropic systems

Serway R A, 1998, Principles of Physics, 602

Sze S M, 2007, Physics of Semiconductor Devices

10.6028/bulletin.282

10.1190/1.9781560802273

Reynolds J M, 2011

10.1109/JRPROC.1954.274680

ASTM, 1975

van Nostrand R G, 1966, Interpretation of Resistivity Data

10.1016/j.rser.2014.12.026

10.1016/j.still.2004.10.004

Schroder D K, 2006

10.1142/S0218625X03005736

10.1063/1.1878213

10.1016/j.phpro.2012.03.568

Hofmann P, 2009, J. Phys.: Condens. Matter, 21, 10.1088/0953-8984/21/1/013003

Hasegawa S, 2007, Chin. J. Phys., 45, 385

10.1116/1.3224898

10.1016/S0081-1947(08)60091-0

10.1063/1.4826490

Miccoli I, 2015, Proc. 1st IEEE Nanotechnology for Instrumentation and Measurement Workshop

10.1063/1.2364603

10.1063/1.4823547

10.1117/12.2042767

10.1063/1.4892652

10.1103/PhysRevB.90.245432

10.1016/S0039-6028(01)01276-6

10.1063/1.1717065

10.1002/j.1538-7305.1958.tb03883.x

10.1016/0038-1101(77)90130-7

Mircea A, 1964, J. Sci. Instrum., 41, 679, 10.1088/0950-7671/41/11/307

Wasscher J D, 1969

10.1063/1.332054

10.1016/j.measurement.2011.11.019

10.1149/1.2113598

10.1063/1.1394186

10.1063/1.1147998

10.1149/1.2086332

10.1109/T-ED.1964.15303

10.1016/0038-1101(64)90038-3

Nehari Z, 1952, Conformal Mapping

Vaughan D E, 1961, Br. J. Appl. Phys., 12, 414, 10.1088/0508-3443/12/8/312

Bewley L V, 1963

van der Pauw L J, 1958, Philips Res. Rep., 13, 1

van der Pauw L J, 1958, Philips Tech. Rev., 20, 220

10.1063/1.1143608

10.1016/0038-1101(71)90029-3

10.1016/0038-1101(72)90159-1

10.1016/0038-1101(77)90044-2

Yamashita M, 1984, Japan. J. Appl. Phys., 23, 1499, 10.1143/JJAP.23.1499

10.1063/1.3125050

10.1103/PhysRevLett.86.5974

10.1103/PhysRevB.73.115102

10.1140/epjb/e2005-00090-x

Hasegawa S, 2010, J. Phys.: Condens. Matter., 22, 10.1088/0953-8984/22/8/084026

10.1177/0040517511416280

10.1007/s10854-013-1524-4

10.1016/j.electacta.2012.08.083

Wang D, 2008, Nanotechnology, 19

10.1016/j.carbon.2003.12.044

Okada T, 1955, Mem. Fac. Sci. Kyusyu Univ., B1, 157

Smith C S, 1958, Solid State Physics, 6, 208ff

10.1063/1.1660656

Wasscher J, 1961, Philips Res. Rep., 16, 301

van der Pauw L J, 1961, Philips Res. Rep., 16, 187

10.1103/PhysRevLett.91.036805

10.1103/RevModPhys.60.1129

10.1063/1.1704046

10.1103/PhysRevB.47.1453

Edler F, 2015

10.1103/PhysRevB.81.035314

10.1063/1.3652905

10.1063/1.1660657

Fuchs B A, 1964

Corinthios M, 2009

Abramowitz M, 1965

10.1557/PROC-315-497

10.1063/1.353845

10.1149/1.2086825

Price W L V, 1972, J. Phys. D: Appl. Phys., 5, 1127, 10.1088/0022-3727/5/6/315

10.1016/0038-1101(73)90171-8

Zimney E J, 2007, Meas. Sci. Technol., 18, 2067, 10.1088/0957-0233/18/7/037

10.1109/10.686795

10.1149/1.2133355

10.1063/1.3006891

Jaschinsky P, 2007

Kai H, 2014, J. Semicond., 35

10.1016/0038-1101(78)90376-3

10.1016/0038-1101(81)90213-6

10.1063/1.329347

10.1063/1.331373

10.1016/0038-1101(74)90001-X

10.1016/0038-1101(78)90365-9

Cornils M, 2008, Proc. 21st IEEE Int. Conf. Microelectronic Test Structures, 23

10.1109/TED.2010.2053493

Cornils M, 2009, Proc. 15th Int. Conf. Solid-State Sensors, Actuators, Microsystems (TRANSDUCERS), 881

Harnwell G P, 1938, Principles of Electricity and Electromgnetism