Surface roughness with nanometer-scale Ag particles generated by ion implantation
Tài liệu tham khảo
Otto, 1992, J. Phys. Condens. Matt., 4, 1143, 10.1088/0953-8984/4/5/001
Cotton, 1992
Moskovits, 1985, Rev. Mod. Phys., 57, 783, 10.1103/RevModPhys.57.783
Schatz, 1993, Fundamentals and Applications of Surface Raman Spectroscopy
Kreibig, 1995, Optical Properties of Metal Clusters, 10.1007/978-3-662-09109-8
Smith, 1993, Methods Enzymol., 226, 482, 10.1016/0076-6879(93)26022-2
Laserna, 1993, Anal. Chim. Acta, 283, 607, 10.1016/0003-2670(93)85274-N
Nabiev, 1993, vol. 20
Mullen, 1991, Anal. Chem., 63, 2196, 10.1021/ac00019a023
Garrell, 1989, Anal. Chem., 61, 401A, 10.1021/ac00181a001
Pal, 1995, Anal. Chem., 67, 3154, 10.1021/ac00114a009
Freeman, 1996, J. Phys. Chem., 100, 718, 10.1021/jp951379s
Grabar, 1995, Anal. Chem., 67, 735, 10.1021/ac00100a008
Freeman, 1995, Science, 267, 1629, 10.1126/science.267.5204.1629
Pemberton, 1987, J. Electroanal. Chem., 217, 79, 10.1016/0022-0728(87)85065-9
Schlegel, 1991, Anal. Chem., 63, 241, 10.1021/ac00003a010
Van Duyne, 1993, J. Chem. Phys., 99, 2101, 10.1063/1.465276
Semin, 1994, Anal. Chem., 66, 4324, 10.1021/ac00095a032
Roark, 1994, Anal. Chem., 66, 261, 10.1021/ac00074a013
Mazzoldi, 1993, Nucl. Instrum. Methods Phys. Res. B, 80/81, 1192, 10.1016/0168-583X(93)90764-W
Matsunami, 1993, Appl. Phys. Lett., 63, 2050, 10.1063/1.110588
Biersack, 1985, vol. 1
Matz, 1996, Mater. Res. Mai
Walls, 1989, J. Phys. Chem., 93, 2976, 10.1021/j100345a025
Lacy, 1996, Anal. Chem., 68, 1003, 10.1021/ac950860b
Skelland, 1994, Nucl. Instrum. Methods Phys. Res. B, 93, 433, 10.1016/0168-583X(94)95631-6
Wood, 1993, Appl. Phys., 74, 5754, 10.1063/1.354194
Pham, 1996, Anal. Chim. Acta, 320, 289, 10.1016/0003-2670(95)00537-4
Burnham, 1991, J. Vac. Sci. Technol., A9, 2548, 10.1116/1.577271
Binnig, 1986, Phys. Rev. Lett., 56, 930, 10.1103/PhysRevLett.56.930
Roark, 1996, Anal. Chem., 68, 473, 10.1021/ac950909d
Zoval, 1996, J. Phys. Chem., 100, 837, 10.1021/jp952291h
Keller, 1991, Surface Sci., 253, 353, 10.1016/0039-6028(91)90606-S
M.T. Pham, W. Matz, D. Moeller, A. Mücklich, Annual Report 1995, 24–28 (Inst. Ion Beam Phys. Mater. Res., FZR).