Surface analysis with Auger electron spectroscopy

Auger, 1923, C.R. (Paris), 177, 169 Auger, 1926, Ann. Phys. (Paris), 6, 183 Rosseland, 1923, Z. Physik, 14, 173, 10.1007/BF01340038 Haworth, 1935, Phys. Rev., 48, 88, 10.1103/PhysRev.48.88 Lander, 1953, Phys. Rev., 91, 1382, 10.1103/PhysRev.91.1382 Harrower, 1956, Phys. Rev., 102, 340, 10.1103/PhysRev.102.340 Tharp, 1967, J. Appl. Phys., 38, 3320, 10.1063/1.1710107 Harris, 1968, J. Appl. Phys., 39, 1419, 10.1063/1.1656374 1974, J. Vacuum Sci. Technol., 11, 23, 10.1116/1.1318578 Weber, 1967, J. Appl. Phys., 38, 4355, 10.1063/1.1709128 Palmberg, 1968, Appl. Phys. Letters, 13, 183, 10.1063/1.1652562 Palmberg, 1969, Appl. Phys. Letters, 15, 254, 10.1063/1.1652989 Haas, 1972, J. Appl. Phys., 43, 1853, 10.1063/1.1661409 Palmberg, 1972, J. Vacuum Sci. Technol., 9, 160, 10.1116/1.1316542 MacDonald, 1971, Appl. Phys. Letters, 19, 315, 10.1063/1.1653933 Larkins, 1982, Appl. Surface Sci., 0, 000 C.J. Powell, N.E. Erickson and T.E. Madey, J. Electron Spectry. Relat. Phenom., to be published. Pantano, 1981, Appl. Surface Sci., 7, 115, 10.1016/0378-5963(81)90065-9 Castle, 1979, J. Electron Spectry. Relat. Phenom., 16, 195, 10.1016/0368-2048(79)85018-5 Musket, 1972, Appl. Phys. Letters, 20, 455, 10.1063/1.1654015 1973, Thin Solid Films, 19, 69, 10.1016/0040-6090(73)90025-4 Garcia, 1970, Phys. Rev., A1, 280, 10.1103/PhysRevA.1.280 Garcia, 1971, Phys. Rev., 3, 955, 10.1103/PhysRevA.3.955 Hennequin, 1968, J. Phys. (Paris), 29, 1053, 10.1051/jphys:019680029011-120105300 Barat, 1972, Phys. Rev., A6, 211, 10.1103/PhysRevA.6.211 Grant, 1975, J. Vacuum Sci. Technol., 12, 481, 10.1116/1.568568 Hennequin, 1974, Surface Sci., 42, 50, 10.1016/0039-6028(74)90005-3 Miller, 1981, Appl. Surface Sci., 9, 214, 10.1016/0378-5963(81)90038-6 Scheibner, 1967, Surface Sci., 8, 247, 10.1016/0039-6028(67)90086-6 Gerlach, 1972, J. Vacuum Sci. Technol., 9, 1043, 10.1116/1.1317717 Seah, 1980, Surface Interface Anal., 2, 222, 10.1002/sia.740020607 Taylor, 1969, Rev. Sci. Instrum., 40, 792, 10.1063/1.1684071 Grant, 1974, Surface Sci., 46, 672, 10.1016/0039-6028(74)90332-X Isett, 1974, Rev. Sci. Instrum., 45, 1382, 10.1063/1.1686507 Springer, 1977, Rev. Sci. Instrum., 48, 74, 10.1063/1.1134853 Pocker, 1976, J. Vacuum Sci. Technol., 13, 507, 10.1116/1.568910 Sickafus, 1971, Rev. Sci. Instrum., 42, 933, 10.1063/1.1685310 Hesse, 1976, Appl. Phys., 11, 233, 10.1007/BF00897058 Houston, 1974, Appl. Phys. Letters, 24, 42, 10.1063/1.1655002 Houston, 1975, Appl. Phys., 6, 281, 10.1007/BF00883765 Sickafus, 1977, Phys. Rev., B16, 1436, 10.1103/PhysRevB.16.1436 Sickafus, 1977, Phys. Rev., B16, 1448, 10.1103/PhysRevB.16.1448 Haas, 1969, Phys. Letters, 30A, 272, 10.1016/0375-9601(69)90988-8 Grant, 1971, Surface Sci., 26, 669, 10.1016/0039-6028(71)90025-2 Siegbahn, 1968, U.S. Air Force Materials Laboratory Technical Report No. AFML-TR-68-189 Kowalczyk, 1974, Phys. Rev., B9, 381, 10.1103/PhysRevB.9.381 Haas, 1970, Appl. Phys. Letters, 16, 172, 10.1063/1.1653149 Grant, 1970, Phys. Letters, 33A, 386, 10.1016/0375-9601(70)90845-5 Coad, 1972, Proc. Royal Soc. (London), A331, 403, 10.1098/rspa.1972.0187 Sickafus, 1973, J. Vacuum Sci. Technol., 10, 43, 10.1116/1.1318040 Légaré, 1977, Surface Sci., 68, 348, 10.1016/0039-6028(77)90222-9 Suleman, 1971, J. Phys., F1, L21, 10.1088/0305-4608/1/4/101 Suleman, 1971, J. Phys., F1, L24, 10.1088/0305-4608/1/4/102 Janssen, 1974, Solid State Commun., 14, 1263, 10.1016/0038-1098(74)90318-4 Chang, 1970, Surface Sci., 23, 283, 10.1016/0039-6028(70)90153-6 Palmberg, 1973, Anal. Chem., 45, 549A Solomon, 1976, Appl. Spectry., 30, 46, 10.1366/000370276774456480 Springer, 1978, Quantitative Surface Analysis of Materials, 643, 64 Haas, 1972, 359 Hooker, 1976, Surface Sci., 55, 741, 10.1016/0039-6028(76)90277-6 Hooker, 1977, Surface Sci., 62, 21, 10.1016/0039-6028(77)90425-3 Grant, 1976, Solid State Commun., 19, 111, 10.1016/0038-1098(76)90446-4 Chesters, 1976, J. Phys., C9, L329 Fuggle, 1976, Solid State Commun., 20, 89, 10.1016/0038-1098(76)91706-3 Vrakking, 1973, Surface Sci., 35, 34, 10.1016/0039-6028(73)90201-X McDonald, 1975, Surface Sci., 51, 249, 10.1016/0039-6028(75)90247-2 Davis, 1976 Davis, 1976, Surface Analysis Techniques for Metallurgical Applications, 596, 52 Grant, 1974, J. Vacuum Sci. Technol., 11, 227, 10.1116/1.1318575 Hooker, 1976, J. Vacuum Sci. Technol., 13, 296, 10.1116/1.568831 Grant, 1976, J. Colloid Interface Sci., 55, 370, 10.1016/0021-9797(76)90044-8 Houston, 1974, Rev. Sci. Instrum., 45, 897, 10.1063/1.1686763 Grant, 1974, Jpn. J. Appl., 811, 10.7567/JJAPS.2S2.811 Pocker, 1974, Rev. Sci. Instrum., 45, 1271, 10.1063/1.1686477 Houston, 1973, Surface Sci., 38, 283, 10.1016/0039-6028(73)90162-3 Grant, 1974, Surface Sci., 44, 617, 10.1016/0039-6028(74)90141-1 Grant, 1974, Surface Sci., 42, 1, 10.1016/0039-6028(74)90002-8 Springer, 1975, Appl. Phys. Letters, 27, 368, 10.1063/1.88480 Grant, 1977, J. Vacuum Sci. Technol., 14, 232, 10.1116/1.569129 Grant, 1976, Surface Sci., 60, 1, 10.1016/0039-6028(76)90002-9 Wehner, 1975 Springer, 1974, Rev. Sci. Instrum., 45, 1113, 10.1063/1.1686821 Coburn, 1974, Crit. Rev. Solid State Sci., 4, 561, 10.1080/10408437308245843 Hofmann, 1980, Surface Interface Anal., 2, 148, 10.1002/sia.740020406 Hooker, 1975, Surface Sci., 51, 328, 10.1016/0039-6028(75)90259-9 Ward, 1981, Surface Interface Anal., 3, 184, 10.1002/sia.740030409 Taylor, 1976, Appl. Phys. Letters, 29, 497, 10.1063/1.89136 Tarng, 1978, J. Vacuum Sci. Technol., 15, 50, 10.1116/1.569436 Thompson, 1979, Surface Technol., 8, 421, 10.1016/0376-4583(79)90005-0 Walls, 1979, Surface Interface Anal., 1, 204, 10.1002/sia.740010607 Janssen, 1977, Surface Sci., 62, 277, 10.1016/0039-6028(77)90443-5 Powell, 1974, Surface Sci., 44, 29, 10.1016/0039-6028(74)90091-0 Coad, 1975, Faraday Discuss. Chem. Soc., 60, 269, 10.1039/DC9756000269 Chou, 1973, Appl. Phys. Letters, 22, 380, 10.1063/1.1654681 Coad, 1970, Surface Sci., 21, 253, 10.1016/0039-6028(70)90232-3 Dawson, 1978, J. Phys., C11, 2183 Burstein, 1980, Mat. Sci. Eng., 42, 207, 10.1016/0025-5416(80)90030-0 Holloway, 1979, Surface Sci., 88, 121, 10.1016/0039-6028(79)90571-5 Mularie, 1971, Surface Sci., 26, 125, 10.1016/0039-6028(71)90118-X Carley, 1979, J. Electron Spectry. Relat. Phenom., 16, 1, 10.1016/0368-2048(79)85001-X Grant, 1975, Surface Sci., 51, 318, 10.1016/0039-6028(75)90257-5 Haas, 1979, Appl. Surface Sci., 2, 433, 10.1016/0378-5963(79)90074-6 Gaarenstroom, 1981, Appl. Surface Sci., 7, 7, 10.1016/0378-5963(81)90056-8 Louchet, 1972, Radiat. Eff., 14, 123, 10.1080/00337577208230482 Thomas, 1980, Nucl. Instrum. Methods, 168, 379, 10.1016/0029-554X(80)91279-3 Haas, 1971, Progress in Surface Science, 1, 155, 10.1016/S0079-6816(71)80004-7 Hawkins, 1975, Bell Laboratories Bibliography No. 303 Horgan, 1973, J. Vacuum Sci. Technol., 10, 523, 10.1116/1.1318058 Tracy, 1969, J. Chem. Phys., 51, 4852, 10.1063/1.1671876 Gjostein, 1973, J. Test. Eval., 1, 183, 10.1520/JTE10002J Katzman, 1979, Appl. Surface Sci., 2, 416, 10.1016/0378-5963(79)90073-4 Takasu, 1973, J. Catalysis, 29, 479, 10.1016/0021-9517(73)90255-8 Bhasin, 1974, J. Catalysis, 34, 356, 10.1016/0021-9517(74)90048-7 Haas, 1970, J. Vacuum Sci. Technol., 7, 43, 10.1116/1.1315825 Palmberg, 1969, Trans. ASM, 62, 1016 Seah, 1973, Proc. Roy. Soc. (London) A, 335, 191, 10.1098/rspa.1973.0121 Joshi, 1975, Scr. Metall., 9, 251, 10.1016/0036-9748(75)90202-1 Ferrante, 1971, Acta Metall., 19, 743, 10.1016/0001-6160(71)90129-5 Dooley, 1972, J. Vacuum Sci. Technol., 9, 145, 10.1116/1.1316536 Browman, 1973, Vacuum, 23, 163, 10.1016/0042-207X(73)91342-0 Miyoshi, 1980, Appl. Surface Sci., 6, 161, 10.1016/0378-5963(80)90142-7 Stoddart, 1975, Nature, 253, 187, 10.1038/253187a0 Papagno, 1980, Thin Solid Films, 67, 157, 10.1016/0040-6090(80)90299-0 Moon, 1973, J. Electrochem. Soc., 120, 581, 10.1149/1.2403504 Henderson, 1972, J. Electrochem. Soc., 119, 772, 10.1149/1.2404325 Tompkins, 1976, J. Electrochem. Soc., 123, 1003, 10.1149/1.2132980 Mathieu, 1978, J. Electrochem. Soc., 125, 1039, 10.1149/1.2131617 Lamartine, 1980, Appl. Surface Sci., 4, 537, 10.1016/0378-5963(80)90097-5 Wittberg, 1981 Moddeman, 1980, 408 Pepper, 1974, J. Appl. Phys., 45, 2947, 10.1063/1.1663707 Pantano, 1975, Appl. Phys. Letters, 26, 601, 10.1063/1.88017 Jach, 1980, Semicond. Insul., 5, 111 Sunderland, 1974, Jpn. J. Appl. Phys. Suppl. 2, 347, 10.7567/JJAPS.2S1.347 Onoda, 1974, Vol. 7, 39 Rynd, 1975, Surface Sci., 48, 22, 10.1016/0039-6028(75)90308-8 Hopfgarten, 1978, Fibre Sci. Technol., 11, 67, 10.1016/0015-0568(78)90038-6 Schwidtal, 1978, Surface Sci., 77, 523, 10.1016/0039-6028(78)90138-3 David, 1981, Appl. Surface Sci., 7, 185, 10.1016/0378-5963(81)90108-2 Haque, 1980, Appl. Surface Sci., 4, 214, 10.1016/0378-5963(80)90130-0 Savage, 1981, Appl. Surface Sci., 7, 142, 10.1016/0378-5963(81)90066-0 Lamartine, 1981, Appl. Surface Sci., 8, 171, 10.1016/0378-5963(81)90013-1 Verhoeven, 1981, Appl. Surface Sci., 8, 95, 10.1016/0378-5963(81)90009-X Shih, 1981, Appl. Surface Sci., 8, 125, 10.1016/0378-5963(81)90011-8 Yang, 1975, J. Electrochem. Soc., 122, 675, 10.1149/1.2134290 Haque, 1973, IEEE Trans. PHP-9, 58 Park, 1979, J. Appl. Phys., 50, 809, 10.1063/1.326048 Morabito, 1973, Thin Solid Films, 19, 21, 10.1016/0040-6090(73)90022-9