Structural and mechanical properties of nano-crystal TiN coatings
Tóm tắt
Từ khóa
Tài liệu tham khảo
Fouilland, L., Imhoff, L., Bouteville, A. et al., Composition and tribological characterization of chemically vapour-deposited TiN layer, Surf. Coat Technol. 1998, 100–101: 146–148[DOI]
Laimer, J., Developments in the deposition of hard coatings by plasma-based techniques, Vacuum, 1990, 40(1–2): 27–32.[DOI]
Hoang, N.H., McKenzie, D. R., McFall, W. D. et al., Properties of TiN films deposited at low temperature in a new plasma-based deposition system, J. Appl. Phys., 1996, 80(11):6279–6285.[DOI]
Johansson, B. O., Sundgren, J. E., Greene, J. E. et al., Growth and properties of singl crystal TiN films depos-ited by reactive magnetron sputtering, J. Vac. Sci. Technol. 1985, A3(2): 303–307.
Patsalas, P., Charitidis, C., Logothetidis, S., The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films. Surf. Coat Technol., 2000, 125: 335–340. [DOI]
Tay, B. K., Shi, X., Yang, H. S. et al., Study of TiN films by filtered cathodic vacuum arc techniques, Surf. Eng., 1999, 15(1): 33–37.
Chou, W. J., Yu, G. P., Huang, J. H., Mechanical properties of TiN thin film coatings on 304 stainless steel substrates, Surf. Coat Technol., 2002, 149: 7–13. [DOI]
Lopez, J. M., Gordillo-Vazquez, F. J., Bohme, O., et al., Low grain size TiN thin films obtained by low energy ion beam assisted deposition, Appl. Surf. Sci., 2001, 173: 290–295. [DOI]
Zhang, C. H., Luo, J. B., Li, W. Z. et al., Mechanical properties of nanocomposite TiN/Si3N4 films synthe-sized by ion beam assisted deposition (IBAD). J. Tribol., 2003, 125: 445–447. [DOI]
Klug, H. P., Alexander, L. E., X-Ray Diffraction Procedures, New York: Wiley, 1974: 687–690.
Cardarelli F., Materials handbook: a concise desktop reference London: Springer-Verlag, 2000: 342–365.
Palumbo, G., Thorpe, S. J., Aust, K. T., On the contribution of triple junctions to the structure and properties of nanocrystalline materials. Scripta Met. et Mat., 1990, 24: 1347–1350. [DOI]
Bollmann, W., Triple-line disclinations representations, continuity and reactions, Philos. Mag. A, 1988, 57(4): 637–649.