Statistical monitoring of nonlinear product and process quality profiles

Quality and Reliability Engineering International - Tập 23 Số 8 - Trang 925-941 - 2007
James D. Williams1, William H. Woodall2, Jeffrey B. Birch2
1General Electric Global Research, Niskayuna, NY 12309, U.S.A.
2Virginia Polytechnic Institute & State University, Blacksburg, VA 24061-0439, U.S.A.

Tóm tắt

AbstractIn many quality control applications, use of a single (or several distinct) quality characteristic(s) is insufficient to characterize the quality of a produced item. In an increasing number of cases, a response curve (profile) is required. Such profiles can frequently be modeled using linear or nonlinear regression models. In recent research others have developed multivariate T2 control charts and other methods for monitoring the coefficients in a simple linear regression model of a profile. However, little work has been done to address the monitoring of profiles that can be represented by a parametric nonlinear regression model. Here we extend the use of the T2 control chart to monitor the coefficients resulting from a parametric nonlinear regression model fit to profile data. We give three general approaches to the formulation of the T2 statistics and determination of the associated upper control limits for Phase I applications. We also consider the use of non‐parametric regression methods and the use of metrics to measure deviations from a baseline profile. These approaches are illustrated using the vertical board density profile data presented in Walker and Wright (Comparing curves using additive models. Journal of Quality Technology 2002; 34:118–129). Copyright © 2007 John Wiley & Sons, Ltd.

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Quality and Reliability Engineering International

Tập 23 Số 8

925-941

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