Statistical design centering and tolerancing using parametric sampling

Institute of Electrical and Electronics Engineers (IEEE) - Tập 28 Số 7 - Trang 692-702 - 1981
K. Singhal1, J.F. Pinel2
1University of Waterloo, Waterloo, Ont., Canada
2Bell Northern Research Limited, Ottawa, ONT, Canada

Tóm tắt

Từ khóa


Tài liệu tham khảo

10.1109/TCT.1973.1083737

10.1109/TCS.1979.1084699

10.1007/BF01588967

cochran, 1977, Sampling Techniques

10.2307/2334280

meyer, 1970, Introductory Probability and Statistical Applications

10.1109/TCT.1972.1083506

pinel, 1975, Tolerance assignment in network design, Proc 1975 IEEE Int Symp Circuits and Syst, 317

kjellstrom, 1979, private communication

gopal, 1978, Efficient statistical analysis and design of systems using regionalization

kjellstrom, 1976, On the efficient use of stochastic optimization in network design, Proc 1976 IEEE Int Symp Circuits and Syst, 714

elias, 1975, New statistical methods for assigning device tolerances, Proc 1975 IEEE Int Symp Circuits and Syst, 329

karafin, 1974, The general component tolerance assignment problem in electrical networks

kahn, 1954, Use of different Monte Carlo sampling techniques, Symp Monte Carlo Methods, 146

pinel, 1977, Efficient Monte Carlo computation of circuit yield using importance sampling, Proc 1977 IEEE Int Symp Circuits Syst, 575

kjellstrom, 1975, Optimization methods for statistical network design, Proc 1975 IEEE Int Symp Circuits and Syst, 321

10.1109/TCS.1978.1084392

10.1109/TCS.1977.1084353

becker, 1977, Design of Systems and Circuits for Maximum Reliability or Maximum Production Yield

10.1002/cta.4490040110

kjellstrom, 1976, private communication