Size-dependent electrical constriction resistance for contacts of arbitrary size: from Sharvin to Holm limits

Materials Science in Semiconductor Processing - Tập 2 Số 4 - Trang 321-327 - 1999
A. Mikrajuddin1, Frank G. Shi2, H.K. Kim2, Kikuo Okuyama1
1Faculty of Engineering, Hiroshima University, Kagamiyama, Hiroshima, 739-8527, Japan
2School of Engineering, 916 Engineering Tower, University of California, Irvine, CA 92697-2575, USA

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