Signal linearity in XPS counting systems

M.P Seah1, I.S Gilmore1, S.J Spencer1
1Centre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK

Tài liệu tham khảo

Seah, 1984, Surface and Interface Anal., 6, 230, 10.1002/sia.740060506 Seah, 1990, J. Electron Spectrosc., 50, 137, 10.1016/0368-2048(90)80015-3 Seah, 1992, Surf. Interface Anal., 18, 240, 10.1002/sia.740180309 Seah, 1995, Surf. Interface Anal., 23, 729, 10.1002/sia.740231013 Seah, 1989, J. Elec. Spectrosc., 48, 209, 10.1016/0368-2048(89)80017-9 Seah, 1993, Surf. Interface Anal., 20, 243, 10.1002/sia.740200309 Seah, 1994, Surf. Interface Anal., 21, 336, 10.1002/sia.740210603 Seah, 1994, Metrologia, 31, 93, 10.1088/0026-1394/31/2/002